Testing and Reliability

Garant předmětu:

Petr Fišer

Přednášející:

Petr Fišer

Cvičící:

Martin Daňhel, Petr Fišer

Předmět zajišťuje:

katedra číslicového návrhu

Anotace:

Students will gain knowledge about circuit testing and about methods for increasing reliability and security. They will get practical skills to be able to prepare a test set with the help of the intuitive path sensitization and to use an ATPG for automatic test generation. They will be able to design easily testable circuits and systems with built-in-self-test equipment. They will be able to compute, analyze, and control the reliability and availability of the designed circuits.

Požadavky:

Digital IC design (BIE-SAP).

Osnova přednášek:

1. Introduction, terminology, defects, faults

2. Test generation for combinational circuits

3. Automatic Test Patterns Generation algorithms (ATPG)

4. Sequential circuits testing, fault simulation

5. Dependability, increasing dependability

6. Dependability models, dependability computation

7. Design for testability

8. Sequential circuit testing - scan design

9. Interconnect testing, SoC and NoC testing

10. Built-in self-test (BIST)

11. Test compression

12. Memory and FPGA testing

Osnova cvičení:

1. Introduction to the course

2. Faults in digital circuits

3. Tests generation for combinational circuits, D-Algorithm

4. ATPG Atalanta, Boolean Differential calculus

5. SAT-based ATPG

6. Testing of sequential circuits

7. Reliability Block Diagrams

8. Markov reliability models

9. Fault Tree Analysis and other reliability models

10. Reliability standards

11. Assessment test, BIST design

12. Assessment

Cíle studia:

Students will gain an overview of circuit testing and methods for increasing reliability and dependability. Students will understand the complexity of fault detection, fault localization, reliability evaluation, and enhancement by solving practical examples and projects. They will be able to optimize the trade-off between introduced redundancy and the measure of testability and dependability of the proposed system. Students will obtain a competence for getting a position of testing engineer in the teams working on complex digital designs.

Studijní materiály:

1. Novák, O. - Gramatová, E. - Ubar, R. : Handbook of Testing Electronic Systems. ČVUT, 2005. ISBN 80-01-03318-X.

2. Velazco, R. - McMorrow, D. - Estela, J. : Radiation Effects on Integrated Circuits and Systems for Space Applications. Springer, 2019. ISBN 978-3-030-04660-6.

3. Navabi, Z. : Digital System Test and Testable Design. Springer, 2011. ISBN 978-1-4419-7547-8.

4. da Silva, F. - McLaurin, T. - Waayers, T. : The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500. Springer, 2006. ISBN 978-0-387-34609-0.

Poznámka:

Informace o předmětu a výukové materiály naleznete na https://courses.fit.cvut.cz/NIE-TSP/

Další informace:

https://courses.fit.cvut.cz/MIE-TSP/

Rozvrh na zimní semestr 2023/2024:

Rozvrh není připraven

Rozvrh na letní semestr 2023/2024:

Rozvrh není připraven

Předmět je součástí následujících studijních plánů:

• Master specialization Software Engineering, in English, 2021 (volitelný předmět)
• Master specialization Computer Security, in English, 2021 (volitelný předmět)
• Master specialization Computer Systems and Networks, in English, 2021 (volitelný předmět)
• Master specialization Design and Programming of Embedded Systems, in English, 2021 (PS)
• Master specialization Computer Science, in English, 2021 (VO)