Special Methods of Devices Quality Evaluation
Code | Completion | Credits | Range | Language |
---|---|---|---|---|
XP13SSD | Z,ZK | 4 | 2P+2L | Czech |
- Garant předmětu:
- Václav Papež
- Lecturer:
- Václav Papež
- Tutor:
- Václav Papež
- Supervisor:
- Department of Electrotechnology
- Synopsis:
-
The evaluation of the principal values determining the quality of the passive and active devices. Measuring methods, their evaluation , identification of systematic faults. The description of the tested device, two ports parameters of the device. Matching of the device to the measuring circuit. The noise of the electronic circuits, optimal noise and power matching. Non-linearity of the „linear“ circuits, intermodulation distortion, measuring of the non-linearity and intermodulations.
- Requirements:
-
The credit reguirements: seminar presentation, one protokol of labs and the student must obtain minimally 50 % of avaliable points in the tests.
- Syllabus of lectures:
-
1.Measuring methods, their evaluation , identification of systematic faults.
2. The description of the tested device, two ports parameters of the device.
3. Matching of the device to the measuring circuit.
4. The noise of the electronic circuits,
5. Optimal noise and power matching.
6. Non-linearity of the „linear“ circuits,
7. Intermodulation distortion,
8. Measuring of the non-linearity and intermodulations.
- Syllabus of tutorials:
-
1.Safety in laboratories. Instruction about lab. measurements - group 1.
2.Nonlinearity and noise of resistors.
3.Matched power amplifier
4.HF matching circuits.
5.Nose figure measurement
6.Matching in noise figure measuring circuits.
7.Evaluation of lab. reports.
8.Instruction about lab. measurements - group 2.
9.Intermodulating distortion measurement.
10.Measurement of non-linearity of linear devices.
11.Transformers and filters with distributed parameters.
12.Active two-ports, scattering parameters.
13.The stability of measuring circuits.
14.Evaluation of lab. reports. A credit.
- Study Objective:
-
A student are well-educated of the principal methods of evaluating of the quality of the passive and active devices
- Study materials:
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[1] Detlefsen, J. ; Siart, U.: Grundlagen der Hochfrequenztechnik. München: Oldenbourg, 2012
[2] Zinke, Brunswig, Lehrbuch der Hochfrequenztechnik, 3. Auflage, Springer-Verlag, Berlin 1986
- Note:
- Further information:
- http://www.fel.cvut.cz/education/bk/predmety/11/85/p11850504.html
- Time-table for winter semester 2024/2025:
- Time-table is not available yet
- Time-table for summer semester 2024/2025:
- Time-table is not available yet
- The course is a part of the following study plans:
-
- Doctoral studies, daily studies (compulsory elective course)
- Doctoral studies, combined studies (compulsory elective course)
- Doctoral studies, structured daily studies (compulsory elective course)
- Doctoral studies, structured combined studies (compulsory elective course)