Fractography and Microanalysis

Course guarantor:

Jan Siegl

Lecturer:

Petr Haušild, Jan Siegl

Tutor:

Petr Haušild, Jan Siegl

Supervisor:

Department of Materials

Synopsis:

Abstract:

Basic and accessible methods of experimental materials characterization in microvolume, their application in the study of material properties and in the domain of failure analysis. Relationships between processing technology, mechanical properties and failure processes.

Requirements:

Syllabus of lectures:

Outline:

1.Physics of methods using the interaction between electron beam and matter.

2.Transmission electron microscopy (TEM) and scanning (SEM) electron microscopy.

3.Nature and detection of signals (SE, AE, BE, EBSD).

4.Image forming and image interpretation.

5.Wavelength and energy dispersion microanalysis.

6.Operating methods, limits, applications.

7.Introduction to fractography.

8.Failure micromechanisms, fractographic features.

9.Fracture classification.

10.Quantitative fractography, possibilities of computer image analysis.

11.Failure analysis (general policy).

12.Case studies.

Keywords:

Microanalysis, wavelength dispersion spectroscopy, energy dispersion spectroscopy, transmission electron microscopy, scanning electron microscopy, fractography, failure analysis.

Syllabus of tutorials:

Study Objective:

Study materials:

Key references:

[1] J.I. Goldstein, et al.: Scanning Electron Microscopy and X-Ray Microanalysis. Springer, 3rd edition 2003.

[2] ASM Handbook - Volume 12: Fractography.

[3] S. Thomas, R. Thomas, A.K. Zachariah, R.K Mishra: Microscopy Methods in Nanomaterials Characterization, Volume 1, Elsevier, 2017

Recommended references:

[1] ASM Handbook Volume 10: Materials Characterization.

Note:

Time-table for winter semester 2024/2025:

Time-table is not available yet

Time-table for summer semester 2024/2025:

Time-table is not available yet

The course is a part of the following study plans:

• Fyzikální inženýrství materiálů (compulsory course in the program)