Diagnostics and Testing

Relations:

In order to register for the course BE3M38DIT, the student must have registered for the required number of courses in the group BEZBM no later than in the same semester.

Course guarantor:

Lecturer:

Tutor:

Supervisor:

Department of Measurement

Synopsis:

The course introduces the fundamentals of the fault-detection, fault tolerance, machine condition monitoring, vibrations based diagnostics, non-destructive testing and testing of analog and digital circuits.

Requirements:

Syllabus of lectures:

1.Diagnostics, prognostics, life cycle

2.Fault modelling, signal/model based fault detection

3.Reliability

4.Fault tolerance, static/dynamic/analytical redundancy, FMEA, FMECA

5.Performance evaluation of diagnostic methods (POD)

6.Diagnostic signal sources and analysis, preprocessing

7.Envelope, cepstral, order analysis, analysis of non-stationary signal

8.Diagnostics of mechanical, electrical and electromechanical systems

9.Diagnostics based on impulse and continuous acoustic emission

10.Non-destructive Testing (NDT), Detection and Localization

11.Ultrasonic NDT, Eddy Current NDT, active thermography

12.Testing of analog and digital circuits, production testing

13.In-circuit Testing, Built-in Self Test, Design for Test

14.Test generation, fault masking, test compression, boundary scan

Syllabus of tutorials:

1.Introduction to Diagnostics, Course Information, Schedule, Lab Practice and Electrical Safety

2.Laboratory Experiment:Fault detection using thermography

3.Laboratory Experiment: Vibrodiagnostics of shaft/gearbox

4.Laboratory Experiment: Eddy Current Non-destructive Testing

5.Laboratory Experiment: Ultrasonic Non-destructive Testing

6.Quiz, Assignment of Individual Project

7.Individual Project

8.Individual Project

9.Individual Project

10.Individual Project

11.Individual Project

12.Individual Project

13.Individual Project

14.Presentation of Individual Project, Assessment

Study Objective:

Study materials:

[1] R. Isermann: Fault-Diagnosis Systems, Springer Verlag, 2006.

Optional:

[2] Ch. Hellier: Handbook of Nondestructive Evaluation, McGraw-Hill 2012.

[3] M. L. Bushnell, V.D. Agrawal: Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits, Springer, Boston, 2005.

Note:

Further information:

No time-table has been prepared for this course

The course is a part of the following study plans: