Nanoscopy and Nanocharacterization
- Garant předmětu:
- Department of Physical Electronics
The lecture covers the basics of nanoscopy and nanocharacterization, it systematically discusses the experimental approaches and methods, gives an overview of raster probe microscopes and electron microscopes. Further, it deals with the scanning tunneling microscopy and elements of probe microscopes, atomic force microscopy and related methods, magnetic and electrostatic force microscopy, Kelvin microscopy, thermal microscopy, scanning near field microscopy and nanotribology. The lecture also decribes the atomic manipulation, nanostructures are classified into natural and artificial nanostructures, microelectromechanical and nanoelectromechanical elements are further discussed, as well as molecular electronics, dip-pen lithography, nanoimprints, self organized nanostructures, and Lego approaches.
The study requires only a general knowledge of physics and does not require specific previous courses.
- Syllabus of lectures:
1. Experimental approaches and methods.
2. Review of raster probe microscopes. Comparison of image formation in near and far field microscopy. Electron microscop.
3. Scanning tunneling microscopy and elements of probe microscopes. History. Imaged surfaces. Resolution power.
4. Atomic force a related microscopies, sample-tip interaction, force characteristics, measuring modes.
5. Magnetic and electrostatic microscopy, Kelvin microscopy, thermal microscopy, SNOM, nanotribology, indentation.
6. Atomic and nanoobject manipulation.
8. Natural nanostructures (colloid, oxides, clays, adhesives, organic molecules, etc.)
9. Artificial nanostructures (nanoparticles, nanofibers and nanotextiles, wires, fullerens a tubes), fabrication and preparation methods.
10. Nanosystems, microelectromechanical (MEMS) elements, nanoelectromechanical (NEMS) elements, microfluidic systems.
11. Molecular electronics, electronic transport in nanostructures, single electron effects.
12. Nanostructure preparation for systems, SPM lithography, dip-pen lithography, nanoimprints, self organized nanostructures, Lego approaches.
- Syllabus of tutorials:
- Study Objective:
Knowledge: solid basic and advanced knowledge of nanoscopy and nanocharacterization, its methods and procedures, especially about the methods which enable study of local topography and electronic properties with nanometer resolution.
Skills: orientation in the field of nanoscopy and nanocharacterization, its methods and procedures, skills in its practical usage, understanding and applications.
- Study materials:
 V. L. Mironov, Fundamentals of Scanning probe microscopy, The Russian Academy of Sciences, Institute of Physics and Microstructures, Nizhniy Novgorod 2004.
 D. Bonnell, Scanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications, Wiley, 2000.
- Further information:
- No time-table has been prepared for this course
- The course is a part of the following study plans: