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CZECH TECHNICAL UNIVERSITY IN PRAGUE
STUDY PLANS
2024/2025

Special Methods of Devices Quality Evaluation

The course is not on the list Without time-table
Code Completion Credits Range Language
XP13SSD Z,ZK 4 2P+2L Czech
Course guarantor:
Václav Papež
Lecturer:
Václav Papež
Tutor:
Václav Papež
Supervisor:
Department of Electrotechnology
Synopsis:

The evaluation of the principal values determining the quality of the passive and active devices. Measuring methods, their evaluation , identification of systematic faults. The description of the tested device, two ports parameters of the device. Matching of the device to the measuring circuit. The noise of the electronic circuits, optimal noise and power matching. Non-linearity of the „linear“ circuits, intermodulation distortion, measuring of the non-linearity and intermodulations.

Requirements:

The credit reguirements: seminar presentation, one protokol of labs and the student must obtain minimally 50 % of avaliable points in the tests.

Syllabus of lectures:

1.Measuring methods, their evaluation , identification of systematic faults.

2. The description of the tested device, two ports parameters of the device.

3. Matching of the device to the measuring circuit.

4. The noise of the electronic circuits,

5. Optimal noise and power matching.

6. Non-linearity of the „linear“ circuits,

7. Intermodulation distortion,

8. Measuring of the non-linearity and intermodulations.

Syllabus of tutorials:

1.Safety in laboratories. Instruction about lab. measurements - group 1.

2.Nonlinearity and noise of resistors.

3.Matched power amplifier

4.HF matching circuits.

5.Nose figure measurement

6.Matching in noise figure measuring circuits.

7.Evaluation of lab. reports.

8.Instruction about lab. measurements - group 2.

9.Intermodulating distortion measurement.

10.Measurement of non-linearity of linear devices.

11.Transformers and filters with distributed parameters.

12.Active two-ports, scattering parameters.

13.The stability of measuring circuits.

14.Evaluation of lab. reports. A credit.

Study Objective:

A student are well-educated of the principal methods of evaluating of the quality of the passive and active devices

Study materials:

[1] Detlefsen, J. ; Siart, U.: Grundlagen der Hochfrequenztechnik. München: Oldenbourg, 2012

[2] Zinke, Brunswig, Lehrbuch der Hochfrequenztechnik, 3. Auflage, Springer-Verlag, Berlin 1986

Note:
Further information:
http://www.fel.cvut.cz/education/bk/predmety/11/85/p11850504.html
No time-table has been prepared for this course
The course is a part of the following study plans:
Data valid to 2024-10-11
For updated information see http://bilakniha.cvut.cz/en/predmet11850504.html