Components of Power Electrical Engineering
Code | Completion | Credits | Range | Language |
---|---|---|---|---|
XE13KVE | Z,ZK | 5 | 2+2L |
- The course is a substitute for:
- Components of Power Electrical Engineering (X13KVE)
- Lecturer:
- Tutor:
- Supervisor:
- Department of Electrotechnology
- Synopsis:
-
Power semiconductor device (diodes, BJTs, thyristors, MOSFETs and IGBTs) and integraed structures (modules). Structures, function, characteristiks and parameters, conditions for reliable operation. Pasive components (rezistore, capacitors, inductors). Induction-less connections. Conductors and cables. Overvoltage and ovecurrent protection. Operating reliability of power components and equipments.
- Requirements:
-
A student has to obtain a credit before an examination
- Syllabus of lectures:
-
1.Introduction
2.Basics of semiconductor device fabrication technology
3.Power diodes
4.Power transistors and thyristors
5.Modern thyristor type devices (GTO, IGCT, LTT)
6.Voltage controlled devices (MOSFET, IGBT)
7.Power integration (PIC, IPM)
8.The cooling of power device.
9.Device encapsulations and heat sinks
10.Overvoltage and overcurrent protection
11.Pasive components (rezistors and capacitors)
12.Inductors and conductors
13.Cables
14.Operating reliability of power devices and components
- Syllabus of tutorials:
-
1.Introduction
2.The first group of laboratory tasks - theory and ezpalation
3.The sekond group of laboratory tasks - theory and explanation
4.The third group of laboratory tasks - theory and explanation
5.The fourth group of laboratory tasks - theory and explanation
6.Measuring of temperature dependence of reverse characteristics of thyristors and diodes
7.Measuring of temperature dependence of forward characteristics of thyristors and diodes
8.Measuring of dynamic paprameters during diode reverse recovery process
9.Measuring of static characteristics of BJT, MOSFET a IGBT in dependence on temperature
10.Measuring og dynamec parameters of semiconductor switches
11.Meausring of the trajectory of the operating point during device switching
12.Measuring of pasive devioce parametrs
13.Measuring of transient thermal impedance
14.Closing
- Study Objective:
- Study materials:
-
1. Benda, V., Gowar, J., Grant, G. A. Power Semiconductor Devices.
Chichester: J.Wiley & Sons. 1999
2. Baliga, J. Power Semiconductor Devices. Boston: PWS Publishing
Company.1995
- Note:
- Further information:
- No time-table has been prepared for this course
- The course is a part of the following study plans:
-
- Heavy-current Engineering- structured studies (compulsory course)