Diagnostic Systems

The course is a substitute for:

Diagnostic Systems (X38DIS)

Lecturer:

Tutor:

Supervisor:

Department of Measurement

Synopsis:

The main aim of subject is scientific and technical information in the field of diagnostic systems. The rapidly growing complexity of technical devices has increased the need to knowledge of new efficient and concurrently cost-effective test methods. The study course concentrates in areas of non-destructive testing, vibration analysis of machines and testing of digital circuits.

Requirements:

Syllabus of lectures:

1. Fundamentals of technical diagnostics

2. Relational structure of object, diagnostic models

3. Applications of failure detection by acoustic emission

4. Vibration of measuring systems

5. Analysis of signal from vibration transducers, cepstrum analysis

6. Ultrasonic non-destructive testing (probes, DGS-diagram, calibration)

7. Methods of electromagnetic testing based on eddy curents

8. Magnetic flux leakage, radiological e.g. X-rays and potencial drop methods of testing

9. Use of infrared radiation paints (thermovision) in diagnostics

10. Diagnostics of digital circuits; fault models

11. Method of sensitized path; functional testing in digital systems

12. Computer-aided test equipment; testing with guided probe

13. In-circuits methods testing for analog and digital circuits

14. Signature analysis; signature and logic analysers

Syllabus of tutorials:

1. Basics of measurement of vibrations. Checking the characteristics of velocity transducers

2. Analysis of vibrodiagnostic signal (spectrum, cepstrum, digital averaging)

3. Kinematics of shaft of small electric motor. Orbit, corbit and ovalness measurements

4. Machine testing using acoustic emission. Acquisition system and data processing

5. Ultrasonic pulse echo measuring techniques. Ultrasonic probes. Use a DGS-diagram

6. Nondestructive testing of metals using eddy current coil and potential four-sensing-head

7. Testability of logic circuits with using logic probe, logic pulser and current tracer

8. Functional testing of digital test object. Processing of table complete test set

9. Software for testing with guided probe. Test of sequential digital circuit

10. Operating principle of signature analysis tester. Analysis of microcomputer motherboard

11. In-circuit testing. Guarding and grounding methods for evaluating of tested element

12. Logic analyzator. Sequential test set of PC-AT motherboard - keyboard communication

13. Interactive demo programs (Brüel & Kjaer, Carl Schenck AG, Aga, Philips)

14. Excursion. Credits

Study Objective:

Study materials:

[1] Weyerer, M., Goldemund, G.: Testability of electronic circuits. Prentice Hall International 1992

[2] Blitz, J.: Electrical and Magnetics Methods of Nondestructive Testing. Adam Hilger 1991

Note:

Further information:

No time-table has been prepared for this course

The course is a part of the following study plans: