Diagnostics of Digital Devices

Předmět je náhradou za:

Diagnostics of Digital Devices (E38DCZ)
Diagnostika číslicových zařízení (X38DCZ)

Přednášející:

Cvičící:

Předmět zajišťuje:

katedra měření

Anotace:

The course is focused on the test and measurement methods in digital

technology. Standard instruments for digital device testing are described

together with methods of their use. Basics of transmission theory,

reflectometry and metastability are introduced. Next part is focused on

measurement on computer buses using logic as well as specialized analyzers

(e.g. SCSI). Serial channel measurement (RS 232C, RS485) is also explained.

At the end the JTAG interface and boundary scan technology is introduced.

Požadavky:

Osnova přednášek:

1. Measurement in digital technology - aims, methods and instruments.

2. Digital circuit technology and its influence on tests methods and results.

3. Logic probes, pulsers and digital pattern generators.

4. Analog scopes - principles, parameters and accessories.

5. Digital scopes - principles, parameters and accessories.

6. Methods and examples of the use of scopes in digital circuits.

7. Transmission line theory for digital signals, reflectometry (TDR).

8. Logic analyzers - principles, parameters and accessories.

9. Methods and examples of the use of logic analyzers in digital circuits.

10. Metastability and synchronization.

11. Measurements on standard parallel buses and interfaces (PCI ).

12. Measurement and diagnostics of serial communication channels.

13. Boundary Scan test method, JTAG interface.

14. Methods and instruments for mass production testing of electronic devices.

Osnova cvičení:

1. Introduction, safety in lab.

2. Measurement of static parameters of digital circuits of different manufacturing technologies.

3. Measurement of dynamic parameters of digital circuits of different manufacturing technologies.

4. Digital scopes - measurements for advanced users.

5. Logic analyzers - measurements for advanced users.

6. Diagnostics of the Centronics interface.

7. PCI bus monitoring with logic analyzer.

8. Reflectometry - cable diagnostics and evaluation of transmission line parameters.

9. Metastability of Flip-Flop circuits.

10. Diagnostics and testing of serial communication channels.

11. Influence of measuring chain on parameters of evaluated signals.

12. Microprocessor debugging using logic analyzer.

13. Boundary Scan diagnostics (JTAG).

14. Discussion of results, assessment.

Cíle studia:

Studijní materiály:

1. Young, Brian: Digital Signal Integrity. Prentice Hall 2001

2. Johnson, H., Graham, M.: High-Speed Digital Design, Prentice Hall 1993

3. Johnson, H., Graham, M.: High-Speed Signal Propagation, Prentice Hall 2003

4. www.tektronix.com

5. www.agilent.com

6. www.ti.com

Poznámka:

Výuka v angličtině. Odb.vol.-Bc.

http://measure.feld.cvut.cz/en/education/courses/XE38DCZ

Další informace:

Pro tento předmět se rozvrh nepřipravuje

Předmět je součástí následujících studijních plánů:

• Společný plán- strukturované anglické studium (volitelný předmět odborný)
• Electronics and Communication Technology - structured studies (volitelný předmět odborný)
• Cybernetics and Measurements- structured studies (volitelný předmět odborný)
• Heavy-current Engineering- structured studies (volitelný předmět odborný)
• Computer Technology- structured studies (volitelný předmět odborný)