Theory of Metrological Processes

The course is not on the list Without time-table

Code	Completion	Credits	Range
W34OZ005	ZK		52P+26C

Course guarantor:

Lecturer:

Tutor:

Supervisor:

Department of Machining, Process Planning and Metrology

Synopsis:

Dimensional metrology.

Geometrical surface properties: shape and position deviations, texture, the effect on function.

Measurement methods and instrumentation.

Coordinate measuring machines, structures, opportunities and procedures measurement software.

Metrological security in the country.

Legal metrology.

Metrological confirmation.

Primary and secondary standardization.

Verification and calibration.

Demonstrating compliance with the specifications.

Theory of errors, accuracy and uncertainty of measurement, calculation procedure.

Laser interferometers and applications for precise measurements.

Requirements:

Syllabus of lectures:

Syllabus of tutorials:

Study Objective:

Study materials:

Servin, M., Quiroga, J. A., Padilla, M.: Fringe pattern analysis for optical metrology: theory, algorithms, and

applications. Hoboken, NJ: Wiley, 2014. 345 p. 9783527411528

International vocabulary of Metrology Basic and general concepts and associated terms (VIM), JCGM/WG2,

Bureau International des Poids et Mesures (BIPM), Pavillon de Breteuil, Sèvres, 2008.

Hocken, R. J., PereiraP. H.: Coordinate Measuring Machines and Systems, Second Edition, Taylor and Francis

Group, 2012

Note:

Further information:

No time-table has been prepared for this course

The course is a part of the following study plans: