Analytical Electron Microscopy

Course guarantor:

Lecturer:

Tutor:

Supervisor:

Department of Materials

Synopsis:

Inelastic scattering processes with energy losses are often element-specific and so they are used for chemical analysis in the transmission electron microscope. The course deals with the theory of the electron scattering, electron energy loss spectroscopy,energy dispersive X-ray spectroscopy and cathodoluminiscence.

Requirements:

Syllabus of lectures:

1. Introduction to analytical methods

2. Elastic scattering of electrons - Rutherford scattering, scattering on shielded potential, Bragg scattering, scattering on phonons

3. Inelastic scattering of electrons - Bethe theory, dielectric formalism, plasmon excitations, differential cross-section, Kramers-Kronig analysis, multiple scattering, ionization edges, energy loss near edge structure (ELNES)

4. Electron energy loss spectroscopy (EELS) spectrometer, energy resolution, detection of electron losses, spatial resolution

5. Energy filtered TEM zero loss filtering, plasmon filtering, elemental mapping

6. Energy dispersive spectroscopy of characteristic X-rays (EDX) - spectrometer, interaction volumes, artefacts

7. Cathodoluminiscence - description of the spectrometer, diffraction on a slit, diffraction on a grid, pair electron-hole recombination, Cerenkov radiation, transition radiation

8. Chemical microanalysis (EELS, EDX)

9. Current research topics - plasmonics, phase manipulation, imaging of atomic orbitals

Syllabus of tutorials:

Study Objective:

Study materials:

[1] R.F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope, 3rd ed., Springer, Berlin, 2011.

[2] R. Brydson, Electron Energy Loss Spectroscopy, Taylor and Francis, London, 2001.

[3]C. C. Ahn, Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS ATLAS, 2nd ed., Wiley-VCH, Weinheim, 2004.

Note:

Further information:

No time-table has been prepared for this course

The course is a part of the following study plans: