Analytical Electron Microscopy

Garant předmětu:

Lecturer:

Tutor:

Supervisor:

Department of Materials

Synopsis:

Inelastic scattering processes with energy losses are often element-specific and so they are used for chemical analysis in the transmission electron microscope. The course deals with the theory of the electron scattering, electron energy loss spectroscopy,energy dispersive X-ray spectroscopy and cathodoluminiscence.

Requirements:

Syllabus of lectures:

1. Introduction to analytical methods

2. Elastic scattering of electrons - Rutherford scattering, scattering on shielded potential, Bragg scattering, scattering on phonons

3. Inelastic scattering of electrons - Bethe theory, dielectric formalism, plasmon excitations, differential cross-section, Kramers-Kronig analysis, multiple scattering, ionization edges, energy loss near edge structure (ELNES)

4. Electron energy loss spectroscopy (EELS) – spectrometer, energy resolution, detection of electron losses, spatial resolution

5. Energy filtered TEM – zero loss filtering, plasmon filtering, elemental mapping

6. Energy dispersive spectroscopy of characteristic X-rays (EDX) - spectrometer, interaction volumes, artefacts

7. Cathodoluminiscence - description of the spectrometer, diffraction on a slit, diffraction on a grid, pair electron-hole recombination, Cerenkov radiation, transition radiation

8. Chemical microanalysis (EELS, EDX)

9. Current research topics - plasmonics, phase manipulation, imaging of atomic orbitals

Syllabus of tutorials:

Study Objective:

Study materials:

[1] R.F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope, 3rd ed., Springer, Berlin, 2011.

[2] R. Brydson, Electron Energy Loss Spectroscopy, Taylor and Francis, London, 2001.

[3]C. C. Ahn, Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS ATLAS, 2nd ed., Wiley-VCH, Weinheim, 2004.

Note:

Further information:

No time-table has been prepared for this course

The course is a part of the following study plans: