Measuring Methods of Semiconductors

The course is not on the list Without time-table

Code	Completion	Credits	Range	Language
11MMPV	Z	2	2	Czech

Garant předmětu:

Lecturer:

Tutor:

Supervisor:

Department of Solid State Engineering

Synopsis:

The purposes of this course are to provide a quantitative knowledge of the electrical and magnetical properties of the semiconductors

Requirements:

Syllabus of lectures:

1. Structure parameters of semiconductor material ^^2. Crystalographic orientation and structure defects ^^3. Carriers concentration and resistivity ^^4. Hall effect, magnetoresistance ^^5. 1-point method, 2-points method, 4-points method ^^6. Van der Pauw method ^^7. Thickness of thin layers ^^8. Resonant methods ^^9. Bridge methods ^^10. Determination of surface states density ^^11. Effective mass, cyklotron resonance ^^12. Elipsometric methods.

Syllabus of tutorials:

Study Objective:

Knowledge: ^^Fundamental effects in solid state physics. ^^Skills: ^^Practical realization of special measurements on semiconductors.

Study materials:

Key references: ^^[1]. Kittel Ch.: Introduction to Solid State Physics, ^^Recommended references: ^^[2]. M.S.Sze, Kwok Kwok Ng: Physics of Semoconductors Devices, John Wiley and Sons, 2007.

Note:

Further information:

No time-table has been prepared for this course

The course is a part of the following study plans: