Methods of characterization in nanotechnologies
Code | Completion | Credits | Range | Language |
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17PMPCHN | Z,ZK | 5 | 2+2 | Czech |
- Lecturer:
- Tutor:
- Supervisor:
- Department of Natural Sciences
- Synopsis:
- Requirements:
- Syllabus of lectures:
- Syllabus of tutorials:
- Study Objective:
- Study materials:
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Chrisey, D.B., Hubler, D.K.: Pulsed Laser Deposition of Thin Films. John Wiley and Sons, Inc., 1994
Prasad, P.N.: Nanophotonics. Wiley Interscience 2004
Miller, J.C., Haglund, R.: Laser ablation and desorption, Vol. 30, Experimental Methods in the Physical Sciences, Academic press, 1998
Cahn Frs, R.V.: Concise Encyclopedia of Materials Characterization, Elsevier, 2005
Brundle, C.R., Evans, C.A., Wilson, S., Fitzpatrick, L.E.: Encyclopedia of materials characterization, Butterworth- Heinemann , 1992
Cullity, B.D.: Elements of X- ray Diffraction, Adison- Wesley, Menlo Park, CA, 1978
Klug, H.P., Alexander, L.E.: X - ray Diffraction Procedures, Wiley, New York 1974
Prasad, P.N.: Nanophotonics. Wiley Interscience 2004
- Note:
- Further information:
- No time-table has been prepared for this course
- The course is a part of the following study plans:
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- Navazující magisterský studijní obor Přístroje a metody pro biomedicínu (compulsory elective course)