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CZECH TECHNICAL UNIVERSITY IN PRAGUE
STUDY PLANS
2011/2012

Methods of characterization in nanotechnologies

The course is not on the list Without time-table
Code Completion Credits Range Language
17PMPCHN Z,ZK 5 2+2 Czech
Lecturer:
Tutor:
Supervisor:
Department of Natural Sciences
Synopsis:
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Study materials:

Chrisey, D.B., Hubler, D.K.: Pulsed Laser Deposition of Thin Films. John Wiley and Sons, Inc., 1994

Prasad, P.N.: Nanophotonics. Wiley Interscience 2004

Miller, J.C., Haglund, R.: Laser ablation and desorption, Vol. 30, Experimental Methods in the Physical Sciences, Academic press, 1998

Cahn Frs, R.V.: Concise Encyclopedia of Materials Characterization, Elsevier, 2005

Brundle, C.R., Evans, C.A., Wilson, S., Fitzpatrick, L.E.: Encyclopedia of materials characterization, Butterworth- Heinemann , 1992

Cullity, B.D.: Elements of X- ray Diffraction, Adison- Wesley, Menlo Park, CA, 1978

Klug, H.P., Alexander, L.E.: X - ray Diffraction Procedures, Wiley, New York 1974

Prasad, P.N.: Nanophotonics. Wiley Interscience 2004

Note:
Further information:
No time-table has been prepared for this course
The course is a part of the following study plans:
Generated on 2012-7-9
For updated information see http://bilakniha.cvut.cz/en/predmet2189606.html