Diagnostics and Reconfiguration of Programmable Circuits
Code | Completion | Credits | Range |
---|---|---|---|
PIK-DRO | ZK | 4 | 0+3 |
- Lecturer:
- Ondřej Novák (gar.)
- Tutor:
- Ondřej Novák (gar.)
- Supervisor:
- Department of Digital Design
- Synopsis:
-
The subject is aimed to help PhD students to understand better methods of reliability and availability improvement of SOC and NOC circuits built on FPGAs and ASICs.
- Requirements:
-
Basic knowledge of digital circuits testing.
- Syllabus of lectures:
-
1.Defects, faults and failures and their models .
2.Optimized ATPG systems and test pattern compression and decompression systems.
3.BIST, test generators, LFSR, CA, built-in analyzers MISR.
4.Mixed-mode testing systems.
5.Realization of systems with improved reliability and security.
6.TSC circuits.
7.Self-repair systems.
8.Reliability evaluations and models, block and Markov models.
- Syllabus of tutorials:
-
Students solve individual project. The project is chosen in such a way that it can help students to improve reliability and availability of their designs.
- Study Objective:
-
Students have to present a short lecture dealing with the project results. After the presentation a discussion about further possibility improvements takes part.
- Study materials:
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Novák, O, Gramatová, E., Ubar, R.: Handbook of Electronic Testing. Vydavatelství ČVUT, srpen 2005, ISBN 80-01-03318-X, 405 stran
- Note:
- Time-table for winter semester 2011/2012:
- Time-table is not available yet
- Time-table for summer semester 2011/2012:
- Time-table is not available yet
- The course is a part of the following study plans:
-
- Informatics (VO)