Diagnostics and Reconfiguration of Programmable Circuits

Lecturer:

Ondřej Novák (gar.)

Tutor:

Ondřej Novák (gar.)

Supervisor:

Department of Digital Design

Synopsis:

The subject is aimed to help PhD students to understand better methods of reliability and availability improvement of SOC and NOC circuits built on FPGAs and ASICs.

Requirements:

Basic knowledge of digital circuits testing.

Syllabus of lectures:

1.Defects, faults and failures and their models .

2.Optimized ATPG systems and test pattern compression and decompression systems.

3.BIST, test generators, LFSR, CA, built-in analyzers MISR.

4.Mixed-mode testing systems.

5.Realization of systems with improved reliability and security.

6.TSC circuits.

7.Self-repair systems.

8.Reliability evaluations and models, block and Markov models.

Syllabus of tutorials:

Students solve individual project. The project is chosen in such a way that it can help students to improve reliability and availability of their designs.

Study Objective:

Students have to present a short lecture dealing with the project results. After the presentation a discussion about further possibility improvements takes part.

Study materials:

Novák, O, Gramatová, E., Ubar, R.: Handbook of Electronic Testing. Vydavatelství ČVUT, srpen 2005, ISBN 80-01-03318-X, 405 stran

Note:

Time-table for winter semester 2011/2012:

Time-table is not available yet

Time-table for summer semester 2011/2012:

Time-table is not available yet

The course is a part of the following study plans:

• Informatics (VO)