Diagnostics of Digital Devices

Lecturer:

Jiří Novák (gar.)

Tutor:

Jiří Novák (gar.)

Supervisor:

Department of Measurement

Synopsis:

Subject is focused on the test and measurement methods in digital technology. Standard instruments for digital device testing are described together with methods of their use. Basics of transmission theory, reflectometry and metastability are introduced. Next part is focused on measurement on computer buses, interfaces and serial communication channels and on methods of software and SW/HW interaction analysis. The "boundary scan? technology for digital circuits testing is introduced as well as methods for FPGA based implementations testing. Finally the mass production testing methods are introduced.

Requirements:

Syllabus of lectures:

1. Measurement in digital technology - reasons, methods and instruments.

2. Digital circuit technology and its influence on tests methods and results.

3. Oscilloscopes - advanced functions, parameters and accessories.

4. Methodology and examples of the use of scopes in digital circuits.

5. Practical approach to digital signal transmission, reflectometry.

6. Logic analyzers - advanced functionality, parameters and accessories.

7. Methodology and examples of the use of logic analyzers in digital circuits.

8. Metastability and synchronization.

9. Standard buses and interfaces testing approach - PCI, SDRAM?

10.Software and SW/HW interaction analysis and testing.

11.Embedded analyzers - analysis of internal functionality of programmable circuits.

12.Measurement on serial interfaces, dedicated analyzers (USB, PCI-e?).

13.JTAG interface, boundary scan method.

14.Production testing methods (AOI, AXI, BIST, ICT ?) and design for test.

Syllabus of tutorials:

1. Introduction, safety in lab.

2. Static and dynamic parameters of digital circuits.

3. Digital oscilloscope.

4. Logic analyzer.

5. Reflectometry - network cable diagnostics.

6. PCI bus monitoring with logic analyzer.

7. Metastability of flip-flop circuits.

8. Real time SW analysis using logic analyzer.

9. Serial buses diagnostics, jitter evaluation.

10.Embedded analysis for internal FPGA testing.

11.Analysis of USB communication using oscilloscope and dedicated analyzer.

12.Boundary scan (JTAG) diagnostics of digital instrument.

13.Influence of measuring chain parameters on digital signal measurements.

14.Discussion of results, assessment.

Study Objective:

Study materials:

[1] Young, B.: Digital Signal Integrity. Prentice Hall 2000, ISBN 978-0130289049

[2] Johnson, H.: High Speed Digital Design: A Handbook of Black Magic. Prentice Hall PTR 1993, ISBN: 978-0133957242

Note:

Further information:

No time-table has been prepared for this course

The course is a part of the following study plans: