Videometry and Contactless Measurement

The course is a substitute for:

Videometry and Contactless Measurement (X38VBM)

Lecturer:

Tutor:

Supervisor:

Department of Measurement

Synopsis:

This course explains the topics of optoelectronic sensors, especially CCD sensors, and their application in the videometry based contactless measurements. The problems of CCD line and area sensors, design of measuring cameras and the methods of signal processing are presented.

Requirements:

Syllabus of lectures:

1. Introduction to videometry

2. Methods of the contactless measurement

3. The analysis of videometry methods

4. Light sources for videometry

5. Design of photodiode sensors and their signal conditioning circuits

6. CCD line and area sensors, the error analysis

7. The design of a control block for CCD sensors, TV standard

8. Analog circuits for the CCD signal processing

9. Video signal digitalization and microcomputer interfacing

10. Principles of optical systems for videometry

11. The parameter calculation of the optical system

12. The use of CCD-TV camera in the videometry

13. The triangulation methods of measurement of shape and position

14. The design of inspection systems for automatic production

Syllabus of tutorials:

1. Introductory exercise

2. Position measurement by the circular differential photodiode

3. PSD sensor parameters measurement

4. Optoelectronic sensors sensitivity measurement

5. CCD TV camera videosignal measurement, TV norm CCIR, PAL

6. Area measurement based on CCD camera and frame grabber

7. Measurement of CCD line sensor

8. Dimensions and shape control of metallic sheet objects by a CCD camera

9. CCD line camera, the precise dimension measurement

10. Measurement of the circularity of planar objects

11. The estimation of geometrical errors of CCD camera based systems

12. The basics of digital image processing for measurement of geometrical parameters

13. Automatic inspection control (dimension measurement) by embedded image processing system MDTR

14. The evaluation of measurement result data

Study Objective:

Study materials:

1. Pollock, C.: Fundamentals of Optoelectronics. IRWIN, Chicago 1995

2. Singh, J.: Optoelectronics - an Introduction to Materials and Devices. McGraw-Hill, 1996

3. Saleh, B.E.A., Teich, M.C.: Fundamentals of Photonics. Wiley, New York 1991

Note:

Further information:

No time-table has been prepared for this course

The course is a part of the following study plans: