Videometry and Contacless Measurement

Lecturer:

Tutor:

Supervisor:

Department of Measurement

Synopsis:

This course explains the topics of optoelectronic sensors, especially CCD sensors, and their application in the videometry based contactless measurements. The problems of CCD line and area sensors, design of measuring cameras and the methods of signal processing are presented.

Requirements:

Syllabus of lectures:

1. Introductory to videometry

2. Methods of the contactless measurement- the use of acoustic, radiation, microwave methods

3. The analysis of videometry methods

4. Lighting sources for videometry

5. Design of fotodiode sensors and their signal circuits

6. CCD line and 2 D area sensors, the error analysis

7. The Design of a control block for CCD sensors, TV standard

8. Analog circuits for the CCD signal processing

9. Video signal digitalization and microcomputer interfacing

10. The selection and parameter calculation of the optical systems

11. The dimension measurement with an enhanced resolution

12. The use of CCD -TV camera in the videometry

13. The triangulation methods of measurement of shape and position

14. The design of automatic production inspection systems

Syllabus of tutorials:

1. Introductory exercise

2. Position measurement by the circular differential photodiode

3. PSD sensor parameters measurement

4. Optoelectronic sensors sensitivity measurement

5. CCD TV camera videosignal measurement, TV norm CCIR, PAL

6. Area measurement based on CCD camera and frame grabber

7. Measurement of CCD line sensor

8. Dimensions and shape control of metallic sheet objects by a CCD camera

9. CCD line camera, the precise dimension measurement

10. Measurement of the circularity of flat objects

11. The estimation of geometrical errors of CCD camera based systems

12. The basics of digital image processing for measurement of geometrical parameters

13. Automatic inspection control (dimension measurement) by embedded image processing system MDTR

14. The evaluation of measurement result data

Study Objective:

Study materials:

1. Pollock, C.: Fundamentals of Optoelectronics. IRWIN, Chicago 1995

2. Singh, J.: Optoelectronics - an Introduction to Materials and Devices. McGraw-Hill, 1996

3. Hecht, E.: Optics. Addison-Wesley Longman, Inc., 1998

4. www.dalsa.com

5. www.kodak.com

Note:

Further information:

No time-table has been prepared for this course

The course is a part of the following study plans:

• Cybernetics and Measurements - Measurement and Instrumentation Systems- structured studies (compulsory course)