Diagnostics of Digital Devices

Lecturer:

Tutor:

Supervisor:

Department of Measurement

Synopsis:

The course is focused on the test and measurement methods in digital technology. Standard instruments for digital device testing are described together with methods of their use. Basics of transmission theory, reflectometry and metastability are introduced. Next part is focused on measurement on computer buses using logic as well as specialized analyzers (e.g. SCSI). Serial channel measurement (RS 232C, RS485) is also explained. At the end the JTAG interface and boundary scan technology is introduced.

Requirements:

Syllabus of lectures:

The lectures will run first 7 weeks for 2 hours.

1. Measurement in digital technology - aims, methods and instruments.

2. Digital circuit technology and its influence on tests methods and results.

3. Logic probes, pulsers and digital pattern generators.

4. Analog scopes - principles, parameters and accessories.

5. Digital scopes - principles, parameters and accessories.

6. Methodology and examples of the use of scopes in digital circuits.

7. Practical approach to digital signal transmission, reflectometry.

8. Logic analyzers - principles, parameters and accessories.

9. Methodology and examples of the use of logic analyzers in digital circuits.

10. Metastability and synchronization.

11. Standard bus testing approach - ISA, VME, PCI.

12. Specialized analyzers, SCSI diagnostics.

13. JTAG interface, boundary scan method.

14. Diagnostics of serial communication channels.

Syllabus of tutorials:

1. Introduction, safety in lab.

2. Static parameters of digital circuits.

3. Dynamic parameters of digital circuits.

4. Digital scopes - measurements for advanced users.

5. Logic analyzers - measurements for advanced users.

6. Diagnostics of the Centronics interface.

7. PCI bus monitoring with logic analyzer.

8. Reflectometry - cable diagnostics.

9. Flip-flop circuits metastability.

10. Serial buses diagnostics.

11. SCSI bus diagnostics using SCSI bus analyzer.

12. Microprocessor debugging using logic analyzer.

13. Systém diagnostics with JTAG interface.

14. Discussion of results, assessment.

Study Objective:

Study materials:

1. Young, Brian: Digital Signal Integrity. Prentice Hall 2001

2. www.tektronix.com

3. www.agilent.com

4. www.ti.com

Note:

Further information:

No time-table has been prepared for this course

The course is a part of the following study plans:

• Common plan- structured studies (elective specialized course)
• Computer Technology- structured studies (elective specialized course)
• Electronics and Communication Technology - structured studies (elective specialized course)
• Cybernetics and Measurements- structured studies (compulsory elective course, elective specialized course)
• Heavy-current Engineering- structured studies (elective specialized course)