Diagnostics and Reliability

Lecturer:

Tutor:

Supervisor:

Department of Computer Science and Engineering

Synopsis:

Fault models for digital systems, test generation for combinational and sequential circuits, test set minimization, fault simulation, signature analysis, built-in self-test, testing LSI and VLSI circuits, hardware for diagnostics. Introduction to reliability, models and characteristics, their evaluation, system redundancy, fault-tolerant systems.

Requirements:

Laboratory report, two tests, oral exam.

Syllabus of lectures:

1. Introduction to diagnostics, basic terms, fault models

2. Test generation for combination circuits

3. Test generation for sequential circuits

4. Test set minimization, random and pseudorandom test vectors

5. Automated test generation systems, fault simulation

6. Diagnostic data compression, signature analysis, fault dictionaries

7. Design for testability, built-in self-test equipment. Boundary scan

8. Fail-safe circuits, totally self-checking circuits. Watchdog

9. Testing LSI and VLSI: microprocessors, memories and PLDs

10. Test equipment

11. Introduction to reliability theory, reliability models

12. Evaluation and prediction of reliability characteristics

13. Use of static and dynamic redundancy on system level

14. Fault-tolerant systems, design and application

Syllabus of tutorials:

1. Faults in digital systems, fault models

2. Intuitive path sensitizing

3. Path sensitizing in circuits with redundancy, D-algorithm

4. Boolean difference, modular approach to test generation

5. Test generation for sequential circuits

6. Test set minimization

7. Diagnostic data compression, fault dictionaries

8. Fail-safe circuits. Preparing laboratory measurements

9. Laboratory measurements Fault detection and location in combinational circuits

10. Laboratory measurements Boundary scan

11. Laboratory measurements Built-in self-test equipment

12. Laboratory measurements Signature analysis

13. Computing of reliability characteristics, redundant systems

14. Markov models of repaired and non-repaired systems

Study Objective:

Study materials:

1. M. Abramovici, M. A. Breuer, A. D. Friedman: Digital Systems

Testing and Testable Design. IEEE Computer Society New York

1990, 652 pp.

Note:

Further information:

No time-table has been prepared for this course

The course is a part of the following study plans:

• Computer Technology - Software Engineering- structured studies (compulsory elective course)
• Computer Technology - System Programming- structured studies (compulsory elective course)
• Computer Technology - Computer Graphics- structured studies (compulsory elective course)
• Computer Technology - Computer Network and Internet- structured studies (compulsory elective course)
• Computer Technology - Designing Digital Systems- structured studies (compulsory course of the branch, compulsory elective course)