Fundamental of High-Frequency Technology

Lecturer:

Karel Hoffmann (gar.), Přemysl Hudec

Tutor:

Karel Hoffmann (gar.), Přemysl Hudec, Tomáš Kořínek

Supervisor:

Department of Electromagnetic Field

Synopsis:

The subject is devoted to principles of rf. and microwave technology with special attention to measurement problems. It introduces to basic parameters characterising rf. and microwave circuits. It makes familiar with measurement of these parameters and with basic principles of measurement instruments. Exercises contain computer simulations based on measured data and real measurements on professional microwave instruments. It is designed for students who meet the rf. technology for the first time.

Requirements:

Basic knowledge of electromagnetic field theory. http://www.elmag.org/doku.php/k317

Syllabus of lectures:

1. Lumped and distributed elements

2. Impedance, VSWR, refl. coef., transformation on line

3. Smith chart, impedance matching

4. Scattering parameters of single ended and balanced devices

5. Basic types of rf. and microwave lines

6. Basic components of rf. measurement technology

7. Scalar measurement of reflections and transmissions, measurement errors

8. Vector measurement of reflections and transmissions

9. Correction methods, precise vector measurement

10. Measurement of balanced circuits

11. Measurement of frequency spectrum

12. Measurement of linear and non-linear circuits

13. Measurement of power

14. Measurement of frequency

Syllabus of tutorials:

1. Introduction to MIDE program

2. Simulation of discontinuity influences on parameters of real circuits

3. Simulation of impedance matching

4. Simulation of balance circuits properties

5. Introduction to work with microwave instruments

6. Basic rf. measurement instruments, generator, detector, power meter, frequency counter

7. Detector calibration

8. Corrected measurement of waveguide components

9. Scalar analyser, measurement of reflection and transmission of coaxial components

10. Vector measurement with 6-port

11. Measurement of passive R, L, C elements and determination of equivalent circuit in the band 20-2000 MHz

12. Analogue spectral analyser 10 MHz - 18 GHz

13. Measurement of frequency spectrum of generators and multipliers

14. Measurement of frequency spectrum of circuits in large signal conditions

Study Objective:

Study materials:

[1] Bryant G. H., Principles of Microwave Measurements, IEE Electrical Measurements Series 5, Peter Peregrinus Ltd. London 1997

[2] Bailey A. E., Microwave Measurements, IEE Electrical Measurement Series 3, Peter Peregrinus Ltd., London 1985

Note:

Time-table for winter semester 2011/2012:

Time-table is not available yet

Time-table for summer semester 2011/2012:

	06:00–08:0008:00–10:0010:00–12:0012:00–14:0014:00–16:0016:00–18:0018:00–20:0020:00–22:0022:00–24:00
Mon	roomT2:A3-415 Hoffmann K. Hudec P. 12:45–14:15 (lecture parallel1) Dejvice CvicebnaroomT2:B2-626 Hudec P. Kořínek T. 14:30–16:00 (lecture parallel1 parallel nr.101) Dejvice Katedra 317, blok B2
Tue
Fri
Thu
Fri

The course is a part of the following study plans:

• Cybernetics and Measurements - Control Engineering- structured studies (compulsory elective course)
• Cybernetics and Measurements - Artificial Intelligence- structured studies (compulsory elective course)
• Cybernetics and Measurements - Measurement and Instrumentation Systems- structured studies (compulsory elective course)
• Cybernetics and Measurements - Aeronautical Engineering and Control Systems- structured studies (compulsory elective course)