Diagnostics of Digital Devices

The course is a substitute for:

Diagnostics of Digital Devices (38DCZ)

Lecturer:

Tutor:

Supervisor:

Department of Measurement

Synopsis:

The course is focused on the test and measurement methods in digital technology. Standard instruments (digital oscilloscopes and logic analyzers) for digital device testing are described together with methods of their use. Basics of transmission theory, reflectometry and metastability are introduced. Measurement methods on computer parallel as well as serial interfaces using different kinds of instruments are explained. Finally the JTAG interface and boundary scan technology is introduced.

Requirements:

Syllabus of lectures:

1. Measurement in digital technology - aims, methods and instruments.

2. Digital circuit technology and its influence on tests methods and results.

3. Logic probes, pulsers and digital pattern generators.

4. Analog scopes - principles, parameters and accessories.

5. Digital scopes - principles, parameters and accessories.

6. Methods and examples of the use of scopes in digital circuits.

7. Transmission line theory for digital signals, reflectometry (TDR).

8. Logic analyzers - principles, parameters and accessories.

9. Methods and examples of the use of logic analyzers in digital circuits.

10. Metastability and synchronization.

11. Measurements on standard parallel buses and interfaces (PCI, ...).

12. Measurement and diagnostics of serial communication channels.

13. Boundary Scan test method, JTAG interface.

14. Methods and instruments for mass production testing of electronic devices.

Syllabus of tutorials:

1. Introduction, safety in lab.

2. Measurement of static parameters of digital circuits of different manufacturing technologies.

3. Measurement of dynamic parameters of digital circuits of different manufacturing technologies.

4. Digital scopes - measurements for advanced users.

5. Logic analyzers - measurements for advanced users.

6. Diagnostics of the Centronics interface.

7. PCI bus monitoring with logic analyzer.

8. Reflectometry - cable diagnostics and evaluation of transmission line parameters.

9. Metastability of Flip-Flop circuits.

10. Diagnostics and testing of serial communication channels.

11. Influence of measuring chain on parameters of evaluated signals.

12. Microprocessor debugging using logic analyzer.

13. Boundary Scan diagnostics (JTAG).

14. Discussion of results, assessment.

Study Objective:

Study materials:

1. Young, Brian: Digital Signal Integrity. Prentice Hall 2001

2. Johnson, H., Graham, M.: High-Speed Digital Design, Prentice Hall 1993

3. Johnson, H., Graham, M.: High-Speed Signal Propagation, Prentice Hall 2003

4. www.tektronix.com

5. www.agilent.com

6. www.ti.com

Note:

Further information:

No time-table has been prepared for this course

The course is a part of the following study plans:

• Common plan- structured studies (elective specialized course)
• Computer Technology- structured studies (elective specialized course)
• Electronics and Communication Technology - structured studies (elective specialized course)
• Cybernetics and Measurements- structured studies (elective specialized course)
• Heavy-current Engineering- structured studies (elective specialized course)