Diagnostics of Digital Devices

The course is a substitute for:

Diagnostics of Digital Devices (XE38DCZ)

Lecturer:

Tutor:

Supervisor:

Department of Measurement

Synopsis:

Subject is focused on test and measurement methods in digital technology. Standard instruments for digital devices testing are described together with methods of their use. Basics of transmission theory, reflectometry and metastability are introduced. Next part is focused on measurement on computer buses using logic as well as specialized analyzers (e.g. SCSI). Serial channels measurement (RS 232C, RS485) is also shown. At the end the JTAG test technology is introduced.

Requirements:

Syllabus of lectures:

1. Measurement in computer technology - reasons, methods and instruments

2. Digital circuit technology and their influence on tests methods and results

3. Logic probes, pulsers and digital pattern generators

4. Analog scopes - functionality, parameters and accessories

5. Digital scopes - functionality, parameters and accessories

6. Methodology and examples of the use of scopes in digital circuits

7. Practical approach to digital signal transmission

8. Logic analyzers - functionality, parameters and accessories

9. Methodology and examples of the use of logic analyzers in digital circuits

10. Metastability and synchronization

11. Standard bus testing approach - ISA, VME, PCI

12. SCSI diagnostics

13. JTAG diagnostics

14. Serial channels diagnostics

Syllabus of tutorials:

1. Introduction

2. DC parameters of basic digital circuits

3. AC parameters of basic digital circuits

4. Digital scopes - digital circuits measurements for advanced users

5. Logic analyzers - measurements for advanced users

6. Diagnostics of the Centronics interface

7. ISA bus monitoring with logic analyzer

8. Reflectometry - cable testing

9. Flip-flop circuits metastability

10. Serial buses testing

11. SCSI bus diagnostics with SCSI bus analyzer

12. Microprocessor debugging using logic analyzer

13. Simple system JTAG diagnostics

14. Final lab, standby term

Study Objective:

Study materials:

1. Young, Brian: Digital Signal Integrity. Prentice Hall 2001

2. www.tektronix.com

3. www.agilent.com

4. www.ti.com

Note:

Further information:

No time-table has been prepared for this course

The course is a part of the following study plans: