Application of Microelectronic Devices

Lecturer:

Tutor:

Supervisor:

Department of Microelectronics

Synopsis:

The target of the course is to teach the students the specific properties of digital and analogue integrated circuits of all degrees of complexity. Stress is put on detailed understanding of differences in application behaviour of monolithic integrated circuits as compared to circuits built of discrete devices and on an optimum utilisation of these differences. Theory is supported by laboratory measurements.

Requirements:

Syllabus of lectures:

1. Properties differences between discrete and integrated devices

2. Analysis of typical internal structures of monolithic devices

3. Main and parasitic parameters of monolithic operational amplifiers

4. Dynamic properties of non-ideal operational amplifiers

5. General application rules for analogue integrated devices

6. Integrated power amplifiers: symmetrical, non-symmetrical

7. Analogue and switched-mode stabilisers, reference sources

8. Static and dynamic parameters of digital circuit families

9. Requirements on power supplies, input signal pre-processing

10. Timing errors in large digital systems, compensation methods

11. Monolithic demodulators of AM and FM signals, amplitude limiters

12. Coders and decoders of various signal types, applications

13. Integrated devices for process control, sensors, actuators

14. Integrated devices for telecommunications and signal processing

Syllabus of tutorials:

1. Laboratory rules and security measures, instrumentation, introductory test

2. Measurement of a wideband monolithic amplifier, frequency response

3. Setting individual tasks for CAD system PCB design

4. - 7. Tutored individual work solving the CAD problem

8. Measurement of a programmable CMOS operational amplifier

9. Measurement of a monolithic power amplifier

10. Measurement of an analogue monolithic voltage stabiliser

11. Measurement of a switched-mode monolithic voltage stabiliser

12. Measurement of interference generated by digital integrated devices

13. Measurement of the properties of an ultrasonic delay line

14. Final grading

Study Objective:

Study materials:

[1] Foit, J.: Struktury a technologie mikroelektroniky. Skripta ČVUT, Praha 1987

[2] Horowitz, P.- Hill, W.: The Art of Electronics. Cambridge University Press, 1990

Note:

Further information:

No time-table has been prepared for this course

The course is a part of the following study plans: