Complex Quality Control

Lecturer:

Tutor:

Supervisor:

Department of Electrotechnology

Synopsis:

Quality and reliability and their time dependence. Quantitative definition of reliability and CQC in Japan and USA. Quantification of reliability according to the ISO 9000 standards. Redundancy. Physics of failures. Arrhenius and Eyring equation. Prediction of reliability. Mathematical modeling. SPC and its application in electrical production. Certification and accreditation of quality of production.

Requirements:

A student has to have an assessment before the examination. Attendance on training is obligatory, a student has to write and present a short semestral thesis to obtain an assessment

Syllabus of lectures:

1. Significance of solving of reliability, concept of quality and its time dependence

2. Reliability, quantitative coefficients. Japanese and U.S.A. way of CQC

3. Marking and investigation of reliability. Redundancy. ISO 9000 standards

4. Physics of failures. Mechanisms of deterioration of electronic components

5. Arrhenius law. Eyring's law. Physical models of reliability

6. Prediction and calculation of reliability, types of measuring methods

7. Optimization of fabrication processes. Modeling, experimental methods

8. Sorting and testing of devices. Influence of devices tolerance on reliability

9. Influence of environment, heat and radiation on reliability

10. Seven Ishikawa tools for quality control

11. Methodology of SPC

12. Study of achievable accuracy

13. Regulation diagrams

14. Quality, certification, accreditation

Syllabus of tutorials:

1. Information about measurements and safety of the work at the laboratory

2. Testing of hermeticity of electronic components

3. Thermography in real time, measurement using thermovision camera

4. Holometry and its use for checking of manufacture

5. Measurement of intensity of ion sources. Topics of individual works

6. Measurement of electrostatic charges

7. Measurement of residual charges on capacitors

8. Optical fibers for temperature sensors

9. Demonstration of diagnostics for quality assessment - EZU

10. The use of dosimetric measurement for quality assessment - FJFI

11. Application of inventions. Protection of patents. Copyright

12. Practical solving of reliability problems - defense of individual works.

13. Practical solving of environmental problems - defense of individual works

14. Evaluation of individual works and record from measurement. A credit

Study Objective:

Study materials:

[1] Middleman, S.: Process engineering analysis in semiconductor device fabrication. McGraw-Hill, N.Y. 1993

Note:

Further information:

No time-table has been prepared for this course

The course is a part of the following study plans:

• Technologické systémy -inženýrský blok (compulsory course)
• Technologické systémy -inženýrský blok (compulsory course)