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CZECH TECHNICAL UNIVERSITY IN PRAGUE
STUDY PLANS
2019/2020

Diagnostics and Testing

The course is not on the list Without time-table
Code Completion Credits Range Language
BE3M38DIT Z,ZK 7 3P+2L
Corequisite:
Safety in Electrical Engineering for a master´s degree (BEEZM)
Lecturer:
Tutor:
Supervisor:
Department of Measurement
Synopsis:

The course introduces the fundamentals of the fault-detection, fault tolerance, machine condition monitoring, vibrations based diagnostics, non-destructive testing and testing of analog and digital circuits.

Requirements:
Syllabus of lectures:

1.Diagnostics, prognostics, life cycle

2.Fault modelling, signal/model based fault detection

3.Reliability

4.Fault tolerance, static/dynamic/analytical redundancy, FMEA, FMECA

5.Performance evaluation of diagnostic methods (POD)

6.Diagnostic signal sources and analysis, preprocessing

7.Envelope, cepstral, order analysis, analysis of non-stationary signal

8.Diagnostics of mechanical, electrical and electromechanical systems

9.Diagnostics based on impulse and continuous acoustic emission

10.Non-destructive Testing (NDT), Detection and Localization

11.Ultrasonic NDT, Eddy Current NDT, active thermography

12.Testing of analog and digital circuits, production testing

13.In-circuit Testing, Built-in Self Test, Design for Test

14.Test generation, fault masking, test compression, boundary scan

Syllabus of tutorials:

1.Introduction to Diagnostics, Course Information, Schedule, Lab Practice and Electrical Safety

2.Laboratory Experiment:Fault detection using thermography

3.Laboratory Experiment: Vibrodiagnostics of shaft/gearbox

4.Laboratory Experiment: Eddy Current Non-destructive Testing

5.Laboratory Experiment: Ultrasonic Non-destructive Testing

6.Quiz, Assignment of Individual Project

7.Individual Project

8.Individual Project

9.Individual Project

10.Individual Project

11.Individual Project

12.Individual Project

13.Individual Project

14.Presentation of Individual Project, Assessment

Study Objective:
Study materials:

[1] R. Isermann: Fault-Diagnosis Systems, Springer Verlag, 2006.

Optional:

[2] Ch. Hellier: Handbook of Nondestructive Evaluation, McGraw-Hill 2012.

[3] M. L. Bushnell, V.D. Agrawal: Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits, Springer, Boston, 2005.

Note:
Further information:
No time-table has been prepared for this course
The course is a part of the following study plans:
Data valid to 2019-10-18
For updated information see http://bilakniha.cvut.cz/en/predmet4831406.html