Nanoparticles and Nanomaterials - Properties and Biomedical Applications

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Code Completion Credits Range Language
17PMP2NCM Z,ZK 4 2+2 Czech
Department of Natural Sciences

Methods for determination of properties (nanocrystalline, grain size, size, shape, surface, chemical composition) of nanoparticles, nanofibres, and nanocomposites. Attention will be given to basic principles of microscopic techniques.

Especially to:

1) optical and confocal microscope, atomic force microscope, scanning tunneling microscope, scanning near-field microscope, etc.

2) crystalline structure related methods based on X-Ray diffraction(XRD) diffraction of high-energetic (RHEED) and low-energetic (LEED) electrons,

3) determination of bonds (including the sp2/sp3 ratio of carbon bonds) by spectrometric methods: Raman scattering, Fourier transformed infrared spectrometry, X-ray photo-electron spectroscopy (XPS),

4) method for elemental analysis: Rutherford backscattering (RBS), Secondary Ion Mass Spectroscopy (SIMS), Glow Discharge Optical Emission Spectroscopy (GDOES), spectroscopy of secondary electrons (EDS, WDS), Particle Induced X-Ray Emission (PIXE),

5) optical properties (elipsometry, transmisivity),

6) mechanical and surface properties (microhadness, adhesion, wettability, z-potential), electric, biocompatible, magnetic properties.

Students will take part in laboratory exercise on devices used in regularly scientific work. Such as: optical microscope, atomic force microscope, scratch tester, nano-indentation, contact angle measurement device, FTIR spectrometer.


credit: compulsory labs plus protocols

exam: two test

Syllabus of lectures:

1 Basic characterization methods - summary, division. Basic principle of microscope methods Optical microscope.

2 Confocal and fluorescent microscope

3 Surface probe microscopy, atomic force microscopy, scanning tunnelling microscope, scanning near-field microscope, etc.)

4 Atomic force microscopy (J. Remsa - Albertov)

5 Method for characterization of biocompatible materials, nanocomposites a multilayers. Requirements on characterization of biomaterials, and principle of method selection.

6 Deans day.

7 Methods for crystalline structure determination (XRD, RHEED), grain size distribution. Test 1.

8 Methods for bonds measurement (Raman scattering, FTIR, XPS, methods for the sp2/sp3 ratio determination for carbon).

9 State holiday.

10 FTIR and her applications for nanotechnology. Raman spectroscopy. J. Remsa - Albertov

11 Chemical composition methods (RBS, PIXE, SIMS, GDOES, EDS, WDX).

12 Optical properties methods (ellipsometry, transmissivity).

13 Methods for mechanical and surface properties (micro-hardness, adhesion, wettability, zeta-potential).

14 Final test (Test č. 2)

Syllabus of tutorials:

1 Atomic force microscopy (Albertov J. Remsa)

2 UV-VIS spectrometry of nanoparticles (Albertov, J. Remsa)

3 Mechanical properties (Albertov, J. Mikšovský)

4 Surface freee energy (Albertov, J. Mikšovský)

5 FTIR (Albertov, J. Remsa)

6 Confocal and fluorescent (Kladno, V. Petráková)

7 Scattering and colloids (V. Petráková)

8 Ramanova spektroskopie uhlíkových materiálu I (V. Petráková)

9 Ramanova spektroskopie uhlíkových materiálu II (V. Petráková)

10 Time resolved fluorescent spectroscopy (V. Petráková)

11 SEM a TEM I (V. Petráková)

12 SEM a TEM II (V. Petráková)

Study Objective:

Students will obtain, both theoretical knowledge of characterization methods and practical experience with selected possibilities of material characterization.

Study materials:

Chrisey, D.B., Hubler, D.K.: Pulsed Laser Deposition of Thin Films. John Wiley and Sons, Inc., 1994

Prasad, P.N.: Nanophotonics. Wiley Interscience 2004

Miller, J.C., Haglund, R.: Laser ablation and desorption, Vol. 30, Experimental Methods in the Physical Sciences, Academic press, 1998

Cahn Frs, R.V.: Concise Encyclopedia of Materials Characterization, Elsevier, 2005

Brundle, C.R., Evans, C.A., Wilson, S., Fitzpatrick, L.E.: Encyclopedia of materials characterization, Butterworth- Heinemann , 1992

Cullity, B.D.: Elements of X- ray Diffraction, Adison- Wesley, Menlo Park, CA, 1978

Klug, H.P., Alexander, L.E.: X - ray Diffraction Procedures, Wiley, New York 1974

Prasad, P.N.: Nanophotonics. Wiley Interscience 2004

Further information:
No time-table has been prepared for this course
The course is a part of the following study plans:
Data valid to 2019-04-25
For updated information see http://bilakniha.cvut.cz/en/predmet4726406.html