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CZECH TECHNICAL UNIVERSITY IN PRAGUE
STUDY PLANS
2019/2020

Nanoparticles and Nanomaterials - Properties and Biomedical Applications

The course is not on the list Without time-table
Code Completion Credits Range Language
17PMP2NCM Z,ZK 4 2P+2C Czech
Lecturer:
Tutor:
Supervisor:
Department of Natural Sciences
Synopsis:

Methods for determination of properties (nanocrystalline, grain size, size, shape, surface, chemical composition) of nanoparticles, nanofibres, and nanocomposites. Attention will be given to basic principles of microscopic techniques.

Especially to:

1) optical and confocal microscope, atomic force microscope, scanning tunneling microscope, scanning near-field microscope, etc.

2) crystalline structure related methods based on X-Ray diffraction(XRD) diffraction of high-energetic (RHEED) and low-energetic (LEED) electrons,

3) determination of bonds (including the sp2/sp3 ratio of carbon bonds) by spectrometric methods: Raman scattering, Fourier transformed infrared spectrometry, X-ray photo-electron spectroscopy (XPS),

4) method for elemental analysis: Rutherford backscattering (RBS), Secondary Ion Mass Spectroscopy (SIMS), Glow Discharge Optical Emission Spectroscopy (GDOES), spectroscopy of secondary electrons (EDS, WDS), Particle Induced X-Ray Emission (PIXE),

5) optical properties (elipsometry, transmisivity),

6) mechanical and surface properties (microhadness, adhesion, wettability, z-potential), electric, biocompatible, magnetic properties.

Students will take part in laboratory exercise on devices used in regularly scientific work. Such as: optical microscope, atomic force microscope, scratch tester, nano-indentation, contact angle measurement device, FTIR spectrometer.

Requirements:

credit: compulsory labs plus protocols

exam: two test

Syllabus of lectures:

1 Basic characterization methods - summary, division. Basic principle of microscope methods Optical microscope.

2 Confocal and fluorescent microscope

3 Surface probe microscopy, atomic force microscopy, scanning tunnelling microscope, scanning near-field microscope, etc.)

4 Atomic force microscopy (J. Remsa - Albertov)

5 Method for characterization of biocompatible materials, nanocomposites a multilayers. Requirements on characterization of biomaterials, and principle of method selection.

6 Deans day.

7 Methods for crystalline structure determination (XRD, RHEED), grain size distribution. Test 1.

8 Methods for bonds measurement (Raman scattering, FTIR, XPS, methods for the sp2/sp3 ratio determination for carbon).

9 State holiday.

10 FTIR and her applications for nanotechnology. Raman spectroscopy. J. Remsa - Albertov

11 Chemical composition methods (RBS, PIXE, SIMS, GDOES, EDS, WDX).

12 Optical properties methods (ellipsometry, transmissivity).

13 Methods for mechanical and surface properties (micro-hardness, adhesion, wettability, zeta-potential).

14 Final test (Test č. 2)

Syllabus of tutorials:

1 Atomic force microscopy (Albertov J. Remsa)

2 UV-VIS spectrometry of nanoparticles (Albertov, J. Remsa)

3 Mechanical properties (Albertov, J. Mikšovský)

4 Surface freee energy (Albertov, J. Mikšovský)

5 FTIR (Albertov, J. Remsa)

6 Confocal and fluorescent (Kladno, V. Petráková)

7 Scattering and colloids (V. Petráková)

8 Ramanova spektroskopie uhlíkových materiálu I (V. Petráková)

9 Ramanova spektroskopie uhlíkových materiálu II (V. Petráková)

10 Time resolved fluorescent spectroscopy (V. Petráková)

11 SEM a TEM I (V. Petráková)

12 SEM a TEM II (V. Petráková)

Study Objective:

Students will obtain, both theoretical knowledge of characterization methods and practical experience with selected possibilities of material characterization.

Study materials:

Chrisey, D.B., Hubler, D.K.: Pulsed Laser Deposition of Thin Films. John Wiley and Sons, Inc., 1994

Prasad, P.N.: Nanophotonics. Wiley Interscience 2004

Miller, J.C., Haglund, R.: Laser ablation and desorption, Vol. 30, Experimental Methods in the Physical Sciences, Academic press, 1998

Cahn Frs, R.V.: Concise Encyclopedia of Materials Characterization, Elsevier, 2005

Brundle, C.R., Evans, C.A., Wilson, S., Fitzpatrick, L.E.: Encyclopedia of materials characterization, Butterworth- Heinemann , 1992

Cullity, B.D.: Elements of X- ray Diffraction, Adison- Wesley, Menlo Park, CA, 1978

Klug, H.P., Alexander, L.E.: X - ray Diffraction Procedures, Wiley, New York 1974

Prasad, P.N.: Nanophotonics. Wiley Interscience 2004

Note:
Further information:
No time-table has been prepared for this course
The course is a part of the following study plans:
Data valid to 2019-09-16
For updated information see http://bilakniha.cvut.cz/en/predmet4726406.html