X-Ray Diffraction Techniques in Solid State

Course guarantor:

Nikolaj Ganev

Lecturer:

Jiří Čapek, Nikolaj Ganev

Tutor:

Nikolaj Ganev

Supervisor:

Department of Solid State Engineering

Synopsis:

The course contains all of the fundamentals required to appreciate the theory and practice of solid state structure analysis with a strong emphasis on the experimental methods for characterisation of real structure of polycrystalline materials.

Requirements:

Syllabus of lectures:

1. The diffraction of X-rays by crystals.

2. Characteristics of X-radiation.

3. X-ray sources and detectors.

4. Experimental techniques for single crystals.

5. X-ray diffraction of polycrystalline materials.

6. Data reduction.

7. Determining of lattice parameters.

8. Diffraction qualitative and quantitative phase analysis.

9. X-ray texture analysis.

10. Macroscopic and microscopic stress determination.

11. Particle size determination.

12. Fundamentals of neutron and electron diffraction.

Syllabus of tutorials:

Study Objective:

Study materials:

Key references:

1. C. Giacovazzo et al.: Fundamentals of Crystallography, Oxford University Press, NY 1992.

2. R. Jenkins, R. L. Snyder: Introduction to X-ray Powder Diffractometry, John Wiley and Sons, NY 1996

3. R. Guinebreti?re: X-ray Diffraction by Polycrystalline Materials, IESTE, 2007

Recommended references

1. V. K. Pecharsky, P. Y. Zyvalij: Fundamentals of Powder Diffraction and Structural Characterization of Materials, Springer, 2005

Note:

Time-table for winter semester 2025/2026:

Time-table is not available yet

Time-table for summer semester 2025/2026:

Time-table is not available yet

The course is a part of the following study plans: