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CZECH TECHNICAL UNIVERSITY IN PRAGUE
STUDY PLANS
2019/2020

Surface Physics 1

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Code Completion Credits Range Language
11FYPO1 ZK 2 2+0 Czech
Lecturer:
Ladislav Kalvoda (guarantor)
Tutor:
Ladislav Kalvoda (guarantor)
Supervisor:
Department of Solid State Engineering
Synopsis:

1. Historical remarks. Geometrical and thermodynamic approach to a surface (fractal surfaces, Gibbs model of ideal surface, surface tension and specific surface free energy, surface relaxation and surface reconstruction). 2. Vacuum and clean surface preparation techniques: Surface contamination, UHV systems, vacuum pumps, vacuum gauges, special techniques of clean surface preparation. 3. Surface chemical composition. Surface sensitivity of traditional „bulk“ methods. Spectroscopy of secondary electrons (SE). Characteristic features of SE energetic spectrum. 4. Electron energy analyzers. Principles of Auger electron spectroscopy (AES) and photoelectron spectroscopy (XPS). 5. Quantitative analysis of surface chemical composition. Construction of SE spectrometers. 6. Mass spectroscopy of secondary particles. SIMS: Basic theoretical aspects, quantitative analysis, assets and drawbacks. Further methods utilizing secondary particles. Construction of spectrometers and ionic sources. 7. Analysis of a depth chemical composition profile: non-destructive method based on variation of the signal registration depth, method of skew cut, surface sputtering. 8. Application of SAXS methods to chemical composition analysis. Microscopic techniques of surface composition analysis (SAEM, SMS, POSAP). 9. Surface structure. Description of 2D-periodic crystalline struktury: Direct and reciprocal lattice. Diffraction on 2D structures: Laue conditions and Ewald construction. Orientation of surface. 10. Surface sensitivity of classical methods of structure analysis. Low energy electron diffraction (LEED), reflection high energy electron diffraction (RHEED). 11. Surface-oriented X-ray diffraction techniques. Field emission electron and ion microscopy. Evanescent EM field techniques. 12. Scanning probe microscopy methods. 13. Surface extended X-ray absorption fine structure (SEXAFS). Simple theoretical prediction of surface structures: Chadi model.

Requirements:

knowledge of structure of solid state and solid state theory (lectures SPL, SPL2, TPL1 and TPL2 at FNSPE)

Syllabus of lectures:

1. Historical remarks. Geometrical and thermodynamic approach to a surface (fractal surfaces, Gibbs model of ideal surface, surface tension and specific surface free energy, surface relaxation and surface reconstruction). 2. Vacuum and clean surface preparation techniques: Surface contamination, UHV systems, vacuum pumps, vacuum gauges, special techniques of clean surface preparation. 3. Surface chemical composition. Surface sensitivity of traditional „bulk“ methods. Spectroscopy of secondary electrons (SE). Characteristic features of SE energetic spectrum. 4. Electron energy analyzers. Principles of Auger electron spectroscopy (AES) and photoelectron spectroscopy (XPS). 5. Quantitative analysis of surface chemical composition. Construction of SE spectrometers. 6. Mass spectroscopy of secondary particles. SIMS: Basic theoretical aspects, quantitative analysis, assets and drawbacks. Further methods utilizing secondary particles. Construction of spectrometers and ionic sources. 7. Analysis of a depth chemical composition profile: non-destructive method based on variation of the signal registration depth, method of skew cut, surface sputtering. 8. Application of SAXS methods to chemical composition analysis. Microscopic techniques of surface composition analysis (SAEM, SMS, POSAP). 9. Surface structure. Description of 2D-periodic crystalline struktury: Direct and reciprocal lattice. Diffraction on 2D structures: Laue conditions and Ewald construction. Orientation of surface. 10. Surface sensitivity of classical methods of structure analysis. Low energy electron diffraction (LEED), reflection high energy electron diffraction (RHEED). 11. Surface-oriented X-ray diffraction techniques. Field emission electron and ion microscopy. Evanescent EM field techniques. 12. Scanning probe microscopy methods. 13. Surface extended X-ray absorption fine structure (SEXAFS). Simple theoretical prediction of surface structures: Chadi model.

Syllabus of tutorials:

N/A

Study Objective:

Knowledge: ^^Understanding the specifics of surface and bulk; orientation among the topics of chemical composition determination or structure of a surface/thin coating. ^^Skills: ^^Orientation in the spectrum of the methods applied to solve the basic task of surface physics; Ability to select the proper method for the problem in question.

Study materials:

Key references: ^^[1]. M. Prutton, Introduction to Surface Physics, Clarendon Press, Oxford 1998. ^^Recommended references: ^^[2]. D.P. Woodruff, T.A. Delchar, Modern Techniques of Surface Science (2nded.) Cambridge University Press, Cambridge 1994.

Note:
Time-table for winter semester 2019/2020:
Time-table is not available yet
Time-table for summer semester 2019/2020:
Time-table is not available yet
The course is a part of the following study plans:
Data valid to 2020-01-23
For updated information see http://bilakniha.cvut.cz/en/predmet24707405.html