Testing and Reliability

The course is not on the list Without time-table
Code Completion Credits Range Language
MI-TSP Z,ZK 4 2+2 Czech
Department of Digital Design

Students gain knowledge about circuit testing and about methods for increasing reliability and security. They will get practical skills to be able to prepare a test set with the help of the intuitive path sensitization and to use an ATPG for automatic test generation. They will be able to design easy testable circuits and systems with built-in-self-test equipment. They will be able to analyze and control reliability and availability of the designed circuits.


Digital IC design (BIE-SAP).

Syllabus of lectures:

1. Introduction to testing of digital circuits, defects, errors, faults, failures.

2. Test generation for combinational circuits, intuitive path sensitization.

3. Automatic Test Patterns Generation (ATPG) algorithms.

4. Sequential circuits testing, fault simulation.

5. Design for Testability (DFT).

6. Sequential circuits testing - the scan design, IEEE 1149.

7. Interconnection testing, SoC testing, IEEE P1500.

8. Built-in Self Test (BIST).

9. Test compression.

10. FPGA and memory testing.

11. Reliability calculation.

12. Fail-safe systems, totally self-checking circuits, on-line testing.

Syllabus of tutorials:

1. 1-3. Test pattern generation and optimization

2. 4-6. Individual project: Fault detection and localisation

3. 7. IEEE 1149 standard application

4. 8-11. Individual project: BIST design

5. 12-13. Individual project: Enhanced reliability system design

Study Objective:

Students will gain an overview about circuit testing and about methods for increasing reliability and security. Students will understand the complexity of fault detection, fault localisation, reliability evaluation and enhancement by solving practical examples and projects. They will be able to optimize the trade-off between introduced redundancy and the measure of testability and security of the proposed system. Students will obtain a competence for getting a position of testing engineer in the teams working on complex digital designs.

Study materials:

L.-T.Wang, C.-W.Wu, X.Wen. VLSI Test Principles and Architectures. Elsevier, 2006, 777 p.

O.Novak, E.Gramatova, R.Ubar. Handbook of Testing Electronic Systems. Czech TU Publishing House, 2005, 395 p.

S.Mourad, Y.Zorian. Principles of Testing Electronic Systems. J.Wiley & Sons, Inc. New York, 2000, 420 p.

M.L. Bushnell, V.D. Agrawal. Essentials of Electronic Testing. Kluwer Academic Publishers, Boston / Dordrecht / London, 2000, 690 p.

E. Dubrova, Fault-Tolerant Design, Springer, 2013, 185 p.

Further information:
No time-table has been prepared for this course
The course is a part of the following study plans:
Data valid to 2019-03-20
For updated information see http://bilakniha.cvut.cz/en/predmet1432106.html