Measuring Methods of Semiconductors
- Department of Solid State Engineering
The purposes of this course are to provide a quantitative knowledge of the electrical and magnetical properties of the semiconductors
- Syllabus of lectures:
1. Structure parameters of semiconductor material ^^2. Crystalographic orientation and structure defects ^^3. Carriers concentration and resistivity ^^4. Hall effect, magnetoresistance ^^5. 1-point method, 2-points method, 4-points method ^^6. Van der Pauw method ^^7. Thickness of thin layers ^^8. Resonant methods ^^9. Bridge methods ^^10. Determination of surface states density ^^11. Effective mass, cyklotron resonance ^^12. Elipsometric methods.
- Syllabus of tutorials:
- Study Objective:
Knowledge: ^^Fundamental effects in solid state physics. ^^Skills: ^^Practical realization of special measurements on semiconductors.
- Study materials:
Key references: ^^. Kittel Ch.: Introduction to Solid State Physics, ^^Recommended references: ^^. M.S.Sze, Kwok Kwok Ng: Physics of Semoconductors Devices, John Wiley and Sons, 2007.
- Further information:
- No time-table has been prepared for this course
- The course is a part of the following study plans: