X-Ray Tensiometry

Lecturer:

Tutor:

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Department of Applied Physics

Synopsis:

Sources of X-Rays for X-Ray diffraction methods. X-Ray monochromatization methods. Use of position sensitive detectors and imaging plates in X-Ray analysis. Single crystal diffractometry. Powder diffractometry. Double-Crystal and Triple-Crystal diffractometry. Diffuse scatering of X-Rays in single crystals and thin layers. X-Ray topography methods.

Requirements:

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Study materials:

Krawitz,A.D.:Introduction to diffraction in materials science and engineering. New York.John Wiley and Sons, 2001, 408 ps. Guinier,A.: X-ray diffraction: in crystals, imperfect crystals, and amorphous bodies.San Francisco. W.H.Freeman and Company,1963, 378ps.

Note:

Time-table for winter semester 2011/2012:

Time-table is not available yet

Time-table for summer semester 2011/2012:

Time-table is not available yet

The course is a part of the following study plans: